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Advanced ATE Fleet Infrastructure for Every Test Need

UTAC Group’s extensive tester fleet represents over 2,000+ advanced test platforms spanning the full spectrum of semiconductor testing requirements to support every semiconductor application.

From mixed-signal logic to high-frequency RF devices, memory, and power testing with proven reliability, our IC testing services and broad portfolio of Automated Test Equipment (ATE) platforms from Teradyne, Advantest, and Cohu accommodate more than 1,000 types of IC packages to ensure the exact configuration for your specific device requirements.

Diamond
Diamond
Fusion MX
Fusion MX
V93K PS1600
V93K PS1600
Ultra Flex
Ultra Flex
V93K
V93K
J750
J750
Mixed Signal, Logic
  • Credence ASL 1000
  • Credence D10
  • Teradyne IFLEX
  • J750E/EX/HD
  • Fusion CX/MX
  • V93K PS1600
  • V93K EXA Scale
  • COHU Diamond X UltraFlex
Analog & Power
  • ETS300
  • ETS364
  • ETS564
  • ETS800Y
  • ETS88
  • T2000IPS
  • uParset
  • PowerTech QT4100
  • AccoTEST STS8200
  • AccoTEST STS8300
Memory / Security
  • Magnum SV/SSV
  • Magnum5
RF
  • UltraFlex UWLX
  • 93K Smart Scale/Wave Scale
  • COHU PAX-AC
  • NI

Equipped with a broad portfolio of ATE platforms supporting high-speed logic, mixed-signal, and RF device testing across engineering characterization and high-volume production environments.

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Choose UTAC Group

Ready to leverage our highly comprehensive, high-volume IC testing ATE infrastructure? Our 2,000+ test platforms are configured and waiting to accelerate your semiconductor testing requirements.

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