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Driving Test Efficiency with Operational Expertise

From automation to quality control, our experienced team ensures your test flow runs smoothly across every device, every time.

Beyond core test capabilities, operational excellence plays a critical role in delivering consistent, high-quality outcomes.

At UTAC Group, our Test Operational Services are built on mature manufacturing processes, smart automation, and rigorous quality control, ensuring reliable, scalable, and risk-mitigated operations across every product line.

Explore how our experienced team and strategic partnerships drive efficient execution and customer confidence in diverse semiconductor markets.

UTAC Test Center of Excellence

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Experience

  • Engineer Manager     >15 year
  • Engineer     >10 year
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Control System

  • 24/7 Realtime OEE monitoring
  • CIM/ Test data management
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Product Market

  • Medical, Automotive, Consumer, Industrial, Mobile, Security, Banking, IOT
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Quality

  • Continuous improvement culture
  • Certified for stringent standard such as EAL6 (security) and automotive
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Test Conditions

  • Wafer probe at -55°C to +150°C,
  • 1280 sites parallelism
  • Final test at -55°C to +155°C, 16 sites parallelism
  • System Level Test (SLT), LN2 pipe cooling
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Strategic Locations

  • Near to foundries, major customer sites, and UTAC Bump/WLCSP facilities.
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Automotive

  • Tri-temp testing (Typically -40°C to +150°C)
  • Certified with IATF 16949:2016 and ISO 9001:2015
  • Handled by certified personnel
  • 15 Years Record Retention
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MEMS & Sensors

  • Mixed Signal logic
  • Analog & Power
  • RF
  • CMOS Image Sensor
  • Security
  • Memory
  • MEMS testing
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Services

  • Turnkey with bump and assembly
  • Wafer Probe / Final Test
  • Burn In (In-house and outsourced)
  • System Level Test (SLT)
  • Full End-Of-Line:
    Bake, Scan, Pack, Ship and Drop-ship
  • NPI and Safe Production Launch
Mature Manufacturing Processes with Safeguarded Risks

Mature Manufacturing Processes with Safeguarded Risks

Established and optimized manufacturing processes with embedded risk mitigation strategies, ensuring high yield, process stability, and consistent product quality across production cycles.

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Accomplished multiple Security Testing set-up from Safe-Launch to Mass production.
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Competitive Overall Equipment Efficiency of 85% with Real Time Monitoring.
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Collaborates closely with customers to drive product maturity.
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Automotive Cold Wafer Testing prowess adding value to customer.
Competitive Technology Advantage

Competitive Technology Advantage

Demonstrated competitive technological advantage through a proven track record in wafer and final test for RF, consumer electronics, automotive, and communication devices—delivering high-yield, cost-effective, and high-throughput test solutions tailored to device-specific requirements.

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High Parallelism
Up to 1,280 sites
Up to 26,000 pins

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Wide range of Tester configuration and advance HW Up to 1024 ch, MX8 board

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Automated Production Recipe management and Program Loading, Paperless Manufacturing

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Automatic Pre-Post Manufacturing process with internally developed scripts for quality control to die level.

Overall Equipment Effectiveness – OEE

OEE supported by adept Engineering staff and subject matter experts in Probe Process.

Control of:
  • Equipment
  • Recipe
  • Lot traceability
  • Alarms
  • HW upkeep
  • Error-Proofing
  • Insertion
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Track record in Test of RF, Consumer, Automotive and Communication devices:

  • RF Antenna tuner, LN Amplifiers, Switches
  • Automotive in car networking, Instrument clusters, EV, Power Modules
  • Consumer/Communication – Sensors, Storage, WL charging, Baseband, Voice control, Noise reduction
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World Class Automated Test Process Capability

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UTAC OEE System:
Traditional to Smart Manufacturing
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Automated LN2 VJ LINE
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Automated Wafer Transfer
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Automated Test Program Control
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Automated Handler Temp Control
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Packing Automation
Future Ready<br />Manufacturing Processes

Future Ready
Manufacturing Processes

Developed future-ready manufacturing processes leveraging hands-free automation and advanced smart manufacturing technologies, enabling real-time data integration and autonomous decision-making to enhance productivity.

<p><strong>AMR+Cobot</strong> replacing manual loading/unloading and material/product transportation.</p>
Automated Test Program Control

AMR+Cobot replacing manual loading/unloading and material/product transportation.

<p>Central command system with Remote access on real time status, assist & enhanced control with big data capturing.</p>
Remote Control

Central command system with Remote access on real time status, assist & enhanced control with big data capturing.

<p>Auto Detect Classification with AI replacing manual inspection decision for AOI, PML, IPQC on image/video.</p>
AI

Auto Detect Classification with AI replacing manual inspection decision for AOI, PML, IPQC on image/video.

Loading & Unloading
Test Cell remote control
Auto Probe mark inspection
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Trust UTAC Group for Operational Excellence in Semiconductor Testing

At UTAC Group, we combine certified manufacturing processes, advanced automation, and a strong culture of continuous improvement to deliver consistent, high-quality outcomes across various semiconductor test operations.

Our experienced team, smart manufacturing systems, high-reliability semiconductor testing and data-driven quality controls ensure operational reliability and test process optimization at scale.

Partner with UTAC Group to unlock operational excellence in semiconductor testing, today and into the future.

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