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Expert Test Development Services:
From Initial Assessment to Production-Ready Test Programs

Test development is the foundation of effective and reliable semiconductor testing.

At UTAC Group, our engineering and production test services go beyond execution. We partner with customers early in the product lifecycle to design, validate, and optimize robust test programs.

Explore how our automated Test Development and Engineering Services accelerate time-to-production, enhance yield, and ensure performance across a wide range of device types and applications.

Test Development Capability

Test Development Capability

Team

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~20
Engineers

75% with 15+ years experience in TD field.

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500+
Projects

covering SoC/ Mixed-Signal / RF / Power / Analog / Sensors.

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ATE
Platforms:

Teradyne Uflex/J750, Advantest V93000, Cohu PAX, and many more.

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Collaboration

with customers across the globe, support all UTAC factories

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Close Collaboration

with ATE supplier Apps engineers, LB / PC partners.

Services

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Assessment to best test solution:
ATE & Config, # of Sites, Development NRE & Leadtime.
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Hardware accessories design & manufacturing:
Load Board / Probe Card / Docking interface / Change Kit.
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Full stack Test Program development:
Mass Production qualification, Characterization, Reliability (QRA), Part Average Test.
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Coverage & Yield improvement.
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Cost of Test (CoT) reduction
through TTR, higher Parallelism, cost-effective ATE migration etc.

Example of Past Projects

Mixed Signal Logic and Analog
Mixed Signal Logic and Analog
  • Microphone ASIC high parallelism sort: 350Mu/year.
  • MCUs, SERDES, SATA, Gigabit Ethernet, Storage, Graphics, Multimedia,
    USB, Firewire, Telecom, Power management, Automotive, ADSL,
    North/South Bridges, Controller & Flash, Codec, NFC, and so on.
Analog and Power
Analog and Power
  • ESD Protection IC – film frame ~600Mu/year
  • Motor driver IC
  • MOSFET, diodes, PMIC
RF
RF
  • PA Switch, Tuner for LTE, WIFI, Bluetooth, Satellite receiver
  • Quad sites Final Test @13.5GHz
  • Tuner Multisite Wafer Sort @ 6GHz
Sensors
Sensors
  • Image Sensor: CCD/CIS
  • Magnetic sensor
Background

Partner With UTAC Group for Professional Test Program Development

Ready to leverage our highly comprehensive, high-volume IC testing ATE infrastructure? Our 2,000+ test platforms are configured and waiting to accelerate your semiconductor testing requirements.