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Scanning Acoustic Microscopy (SAM)

Scanning Acoustic Tomography is a non-destructive failure analysis technique which uses high frequency ultrasonic energy to image internal features, characterize material properties and detect defects via an acoustic wave. It is used for detecting disbonds or delamination between package interfaces, voids and cracks using the pulse-echo mode (C-scan) and through transmission mode operation (Thru-scan) in IC package failure analysis.